The workshop aimed at improving the understanding of the patent system, focusing on empirical analysis, methodology, and the use of the PATSTAT database. The speakers provided world-leading contributions from complementary standpoints: the Academia, the EPO, the US patent and trademark office (USPTO), WIPO, OHIM, national Patent Offices, the OECD, and the European Commission. Patent analysis has become, in particular since the creation of the worldwide EPO database, a mainstream tool for evaluation a variety of issues on a quantitative basis: R&D performance and benchmarking, Sources and flows of knowledge, internationalisation and cooperation, etc. Along this line of work, the JRC-IPTS, especially within the PREDICT project developed for e European Commission's Directorate General for Information Society and Media (INFSO) has gained an acknowledged role by developing original methods and results that serve the world community of patent analysts. Part of this role has built, since the very beginning, on the organisation of a community of researchers, meeting once a year in Seville, and exchanging about best practices, new results and new questions. For more information, see:
Workshop presentations:Session 1: Developments in patent and innovation policy / 1 Chair: Lucio Picci – University of Bologna
Session 2: Computing patent statistics / 1 – Matching & merging patent-based datasets Chair: Giuditta De Prato, JRC-IPTS, European Commission
Session 3: Developments in patent and innovation policy / 2 Chair: Nikolaus Thumm, EPO
Session 4: Measuring patents and the patent systems / 1 Chair: Moshaid Khan, WIPO
Session 5: Measuring patents and the patent systems / 2 Chair: Nathan Wajsman, OHIM
Session 6: Computing patent statistics /2 – Patent-based indicators Chair: Lucio Picci – University of Bologna
Session 7: Collaboration and internationalization in patenting activities Chair: Marc Bogdanowicz – JRC-IPTS, European Commission
Session 8: The uses of the patent systems Chair: Marc Bogdanowicz – JRC-IPTS, European Commission
Related Publications & Links:
Contact:Giuditta.De-Prato(at)ec.europa.eu |